Testing Capabilities
Multi-stage electrical testing to verify that reclaimed components meet their original electrical specification.
Memory ICs
LPDDR4 · LPDDR5 · NAND Flash · NOR Flash
Storage ICs
eMMC 5.1 · UFS 2.1 · UFS 3.1
Test Stages
Characterisation · Parametric · Functional
Output Grades
Grade A · Grade B · Rejected (not supplied)
Electrical testing is the core of RELINK's quality assurance process. Every component that passes visual inspection enters a multi-stage test sequence covering electrical characterisation, parametric verification, and functional testing at rated speed. Test results determine the component's grade and inform the traceability record that accompanies it through the supply chain.
Stage by Stage
Electrical Characterisation
Initial electrical characterisation measures key parameters including supply current, leakage, and I/O impedance. Components that fail characterisation are rejected before proceeding to functional test.
- Supply current measurement at rated voltage
- Leakage current measurement
- I/O impedance and continuity check
- Rejection of components outside specification limits
Parametric Testing
Parametric testing verifies that the component's electrical parameters — timing, voltage levels, and interface compliance — meet the original device specification. Testing is performed against the component's datasheet specification.
- Timing parameter verification against datasheet
- Voltage level and threshold verification
- Interface compliance check (LPDDR, eMMC, UFS protocols)
- Results logged against component lot record
Functional Testing
Functional testing exercises the component at its rated operating speed and verifies correct operation across the full address space (memory) or full capacity (storage). Components are tested under representative operating conditions.
- Full address space test for memory ICs
- Full capacity read/write test for storage ICs
- Operation at rated speed and voltage
- Error detection and failure mode logging
Grading & Binning
Test results are used to assign each component a condition grade. Grade A components pass all test stages at full specification. Grade B components pass functional test but show minor parametric deviations within acceptable limits. Failed components are rejected.
- Grade A: passes all stages at full specification
- Grade B: functional, minor parametric deviation within limits
- Rejected: fails any test stage — not supplied
- Grade assigned to lot record and shipping documentation
Test Record & Documentation
Test results are recorded at the lot level and retained. Test reports are available to buyers on request. The test record forms part of the traceability chain from source board to delivered component.
- Lot-level test records retained
- Test reports available to buyers on request
- Pass/fail counts and failure modes documented
- Records link to source board lot for full traceability
Want to Know More?
Contact us with your technical requirements or questions about our process and capabilities.
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